NIST Random Bit Generation Workshop 2016
- 07 June 2016 /
The HECTOR consortium participated at the NIST Random Bit Generation Workshop on 2nd-3rd May 2016 in Washington/USA.
Viktor Fischer, on behalf of the HECTOR consortium, presented and contributed with "Sources of randomness in digital devices and their testability". NIST is in the process of completing the developemnt of approved methods for random bit generation and we are proud to announce that from this presentation three propositions have been accepted and will be taken into account.